The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 30, 2014

Filed:

Sep. 15, 2011
Applicants:

Bernard Fritz, Eagan, MN (US);

James Allen Cox, New Brighton, MA (US);

Peter L. Reutiman, Crystal, MN (US);

Inventors:

Bernard Fritz, Eagan, MN (US);

James Allen Cox, New Brighton, MA (US);

Peter L. Reutiman, Crystal, MN (US);

Assignee:

Metrologic Instruments, Inc., Blackwood, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 5/08 (2006.01); G06K 7/10 (2006.01); G02B 27/00 (2006.01);
U.S. Cl.
CPC ...
G06K 7/10633 (2013.01); G02B 27/0031 (2013.01);
Abstract

A laser scanning system having a laser scanning field, and a laser beam optics module with an optical axis and including: an aperture stop disposed after a laser source for shaping the laser beam to a predetermined beam diameter; a collimating lens for collimating the laser beam produced from the aperture stop; an apodization element having a first and second optical surfaces for extending the depth of focus of the laser beam from the collimating lens; and a negative bi-prism, disposed after the apodization element, along the optical axis, to transform the energy distribution of the laser beam and cause the laser beam to converge to substantially a single beam spot along the far-field portion of the laser scanning field, and extend the depth of focus of the laser beam along the far-field portion of the laser scanning field.

Published as:

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