The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 30, 2014

Filed:

Oct. 15, 2012
Applicant:

Mitutoyo Corporation, Kawasaki, JP;

Inventor:

Shuji Hayashida, Kawasaki, JP;

Assignee:

Mitutoyo Corporation, Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 3/18 (2006.01);
U.S. Cl.
CPC ...
G01B 3/18 (2013.01);
Abstract

A micrometer includes: a displacement detector that detects a displacement of a spindle; a display device that is rotatably attached to a fixed sleeve; and a control device that controls the display device. The display device includes: an image display section that displays an image including a measurement value based on the displacement detected by the displacement detector; a surface member that faces the image display section and has a touch surface; a position sensor that detects a position pressed on the touch surface; and a support member that supports the image display section, the surface member and the position sensor while the touch surface is exposed to an outside, the support member being rotatably attached to the fixed sleeve.


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