The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 23, 2014
Filed:
Dec. 02, 2008
Applicants:
Antonino LA Malfa, Catania, IT;
Marco Messina, Augusta, IT;
Inventors:
Antonino La Malfa, Catania, IT;
Marco Messina, Augusta, IT;
Assignee:
Micron Technology, Inc., Boise, ID (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 7/04 (2006.01); G06F 12/14 (2006.01); G06F 13/00 (2006.01); G06F 17/30 (2006.01); G11C 7/00 (2006.01); G06F 21/00 (2013.01); G06F 11/00 (2006.01); G01R 31/28 (2006.01); G11C 7/24 (2006.01); G06F 21/74 (2013.01); G06F 21/62 (2013.01); H04L 9/32 (2006.01); G06F 21/79 (2013.01); G11C 29/46 (2006.01);
U.S. Cl.
CPC ...
G06F 21/79 (2013.01); G11C 7/24 (2013.01); G06F 21/74 (2013.01); G06F 21/6209 (2013.01); G06F 12/1433 (2013.01); H04L 9/3226 (2013.01); G11C 29/46 (2013.01);
Abstract
A semiconductor memory may be provided with a built-in test mode that is accessible through a password protection scheme. This enables access to a built-in test mode after manufacturing, if desired. At the same time, the password protection prevents use of the built-in test mode to bypass security features of the memory.