The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 23, 2014

Filed:

Jan. 10, 2014
Applicant:

Tokyo Electron Limited, Tokyo, JP;

Inventors:

Masahiro Yamada, Boise, ID (US);

Kenya Iwasaki, Tokyo, JP;

Hiroshi Nishikawa, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/00 (2006.01); H01L 25/065 (2006.01); H01L 21/683 (2006.01); H01L 21/66 (2006.01); H01L 21/78 (2006.01);
U.S. Cl.
CPC ...
H01L 22/12 (2013.01); H01L 2224/48091 (2013.01); H01L 2221/68381 (2013.01); H01L 2224/45144 (2013.01); H01L 25/0657 (2013.01); H01L 21/6836 (2013.01); H01L 2224/73265 (2013.01); H01L 2225/0651 (2013.01); H01L 2221/68327 (2013.01); H01L 2224/32145 (2013.01); H01L 2225/06568 (2013.01); H01L 21/78 (2013.01); H01L 2225/06555 (2013.01);
Abstract

A method for separating a multiple number of semiconductor devices or semiconductor integrated circuits from a wafer on which the multiple number of semiconductor devices or semiconductor integrated circuits are formed is provided. The method includes: forming, on a surface of the wafer, a mask layer through which a line-shaped pattern to be removed for separating the semiconductor devices or semiconductor integrated circuits is exposed; and etching the exposed pattern to a depth equal to or larger than about ⅔ of a thickness of the wafer. The line-shaped pattern is formed so as to prevent a test device formed on a gap between the semiconductor devices or semiconductor integrated circuits from remaining on separated semiconductor devices or semiconductor integrated circuits.


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