The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 16, 2014

Filed:

Sep. 10, 2012
Applicants:

Yuan LI, San Diego, CN;

Julien Nicolas, San Diego, CA (US);

Jianbin Zhu, Poway, CN;

Inventors:

Yuan Li, San Diego, CN;

Julien Nicolas, San Diego, CA (US);

Jianbin Zhu, Poway, CN;

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 13/00 (2006.01); H04L 1/00 (2006.01);
U.S. Cl.
CPC ...
H04L 1/0068 (2013.01);
Abstract

Provided are devices, systems and methods for rate matching and de-rate matching on digital signal processors. In one embodiment, a device for rate matching and de-rate matching, includes an interface for receiving a plurality of blocks of data and digital signal processor configured to pre-compute permutation parameters common to the plurality of blocks, wherein the plurality of blocks are subject to a set of given puncturing parameters and receive a set of pre-computed puncturing thresholds. For one or more blocks in the plurality of blocks, the DSP computes a block signature from the pre-computed puncturing thresholds; matches the block signature to one of a set of pre-computed zone signatures, derives a zone index corresponding to the one pre-computed zone signature, and applies pre-computed permutation and puncturing transformations corresponding to the zone index to the block.


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