The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 16, 2014
Filed:
Jan. 24, 2013
Texas Instruments Incorporated, Dallas, TX (US);
Rubin Ajit Parekhji, Bangalore, IN;
Srivaths Ravi, Bangalore, IN;
Prakash Narayanan, Bangalore, IN;
Milan Shetty, Irvine, CA (US);
Texas Instruments Incorporated, Dallas, TX (US);
Abstract
A method of testing devices under test (DUTs) and testing system are disclosed. The method comprises generating at least one control signal associated with a test pattern structure received from a testing system. The method further comprises selecting M1 number of ports from M number of I/O ports in the DUT to receive scan input corresponding to the test pattern structure based on the control signal, selecting M2 number of ports from the M number of I/O ports to provide scan output based on the control signal, wherein each of M1 and M2 is a number selected from 0 to M, and wherein a sum of M1 and M2 is less than or equal to M. Thereafter, the method comprises performing a scan testing of the DUT based on the scan input provided to the M1 number of ports and receiving the scan output from the M2 number of ports.