The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 09, 2014
Filed:
Nov. 28, 2011
Frank E. Gennari, San Jose, CA (US);
Ya-chieh Lai, Mountain View, CA (US);
Frank E. Gennari, San Jose, CA (US);
Ya-Chieh Lai, Mountain View, CA (US);
Cadence Design Systems, Inc., San Jose, CA (US);
Abstract
A system and method for evaluating a design layout by identifying squish patterns for configurations of shapes in windows defined for anchors in the layout, identifying deltas between edges of elements in the windows and reducing each delta to a single width are described. Identified squish patterns may be compared to known patterns to determine if the squish pattern is a known good or bad pattern. A squish pattern may be represented by a pixel map such that each pixel is a reduced delta in the window and each pixel has a bit representing a layer in a multi-layer layout. A plurality of stored squish patterns may be searched to identify a matching squish pattern, a specific configuration of the squish pattern, or configurations of the squish pattern having deltas within a specified range.