The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 09, 2014

Filed:

May. 09, 2008
Applicants:

Takashi Nishida, Gifu-ken, JP;

Shenglan LI, Gifu-ken, JP;

Chizuka Kai, Tokyo, JP;

Kunimitsu Toyoshima, Osaka, JP;

Inventors:

Takashi Nishida, Gifu-ken, JP;

Shenglan Li, Gifu-ken, JP;

Chizuka Kai, Tokyo, JP;

Kunimitsu Toyoshima, Osaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); C12Q 1/06 (2006.01); G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
C12Q 1/06 (2013.01);
Abstract

Colonies growing on a culture medium surface may be more accurately counted with reduced variation in the counts obtained by capturing a plurality of images of the entire culture medium surface, wherein successive images are captured following rotation of the culture medium surface relative to the image capture apparatus by n/360 degrees where n is the number of images to be captured; performing data processing on image data of the entire culture medium surface of the petri dish at each specified angle; and the number of colonies in the petri dish is calculated by performing numerical processing on the number of colonies counted separately at each specified angle.


Find Patent Forward Citations

Loading…