The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 09, 2014

Filed:

Jun. 26, 2013
Applicant:

Phison Electronics Corp., Miaoli, TW;

Inventors:

Kuo-Yi Cheng, Taipei, TW;

Wei Lin, Taipei, TW;

Yu-Hsiang Lin, Yunlin County, TW;

Shao-Wei Yen, Kaohsiung, TW;

Kuo-Hsin Lai, Hsinchu County, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 16/06 (2006.01); G11C 16/08 (2006.01); G11C 16/26 (2006.01);
U.S. Cl.
CPC ...
G11C 16/26 (2013.01); G11C 16/08 (2013.01);
Abstract

A data reading method for a rewritable non-volatile memory module is provided. The method includes determining a corresponding read voltage based on a critical voltage distribution of memory cells of a word line. The method further includes: if the critical voltage distribution of the memory cells is a right-offset distribution, applying a set of right adjustment read voltage to the word line to read a plurality of bit data as corresponding soft values; and decoding the corresponding soft values to obtain page data stored in the memory cells. Herein, the set of right adjustment read voltage includes a plurality of positive adjustment read voltages and a plurality of negative adjustment read voltages and the number of the positive adjustment read voltages is more than the number of the negative adjustment read voltages. Accordingly, storage states of the memory cells can be identified correctly.


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