The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 09, 2014

Filed:

Oct. 22, 2013
Applicant:

Fei Company, Hillsboro, OR (US);

Inventors:

Lubomir T{dot over (u)}ma, Brno, CZ;

Josef {hacek over (S)}esták, B{hacek over (r)}eclav, CZ;

Assignee:

FEI Company, Hillsboro, OR (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G21K 5/08 (2006.01); H01J 37/26 (2006.01); H01J 37/141 (2006.01); H01J 37/20 (2006.01);
U.S. Cl.
CPC ...
G21K 5/08 (2013.01); H01J 2237/1415 (2013.01); H01J 37/265 (2013.01); H01J 37/1413 (2013.01); H01J 2237/1035 (2013.01); H01J 37/20 (2013.01); H01J 2237/2813 (2013.01); H01J 2237/2802 (2013.01);
Abstract

The invention relates to a charged-particle apparatus having The apparatus has a first configuration to position the sample, mounted on the first stage, with respect to the optical axis and a second configuration, having a second lens pole mounted on the first stage and intersecting the optical axis, equipped with a second sample stage to position the sample between the two lens poles and is movable with respect to the optical axis, causing the optical properties of the magnetic immersion lens to differ in the two configurations, and can, in the second configuration, be changed by positioning the second lens pole using the first stage, thus changing the magnetic circuit.


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