The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 09, 2014

Filed:

Jun. 18, 2010
Applicants:

Roland Geyer, Mattmenstetten/Rossau, DE;

Werner Halg, Mannedorf, CH;

Michael Vogeser, Munich, DE;

Inventors:

Roland Geyer, Mattmenstetten/Rossau, DE;

Werner Halg, Mannedorf, CH;

Michael Vogeser, Munich, DE;

Assignee:

Tecan Trading AG, Mannedorf, CH;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 49/00 (2006.01); G01N 30/02 (2006.01);
U.S. Cl.
CPC ...
H01J 49/0009 (2013.01); H01J 49/0036 (2013.01); G01N 30/02 (2013.01);
Abstract

Test method checks and compensates ion yield variances in a mass spectrometer and includes feeding an eluate of a chromatographic separation to the spectrometer, continuously ad-mixing a separate target analyte solution at known concentration and constant flow rate to the eluate, injecting the mixture into the spectrometer and generating a detector signal for the mixture. A spectrogram is captured which includes an integration line and a mass-spectrographic peak of the target analyte, the integration line being a lasting background signal underlaid to the mass-spectrometric analysis of the eluate, then evaluating the spectrogram by capturing an integrated mass-spectrographic peak area above the integration line and an area which is found under the integrated peak area of the target analyte by perpendicular drop lines from the peak integration line and forming a mathematical relationship from the determined mass-spectrographic areas.


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