The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 02, 2014
Filed:
Mar. 30, 2011
Applicants:
Ziv Aviv, Bat Hefer, IL;
Omri Govrin, Pardes-Hana-Karkur, IL;
Inventors:
Ziv Aviv, Bat Hefer, IL;
Omri Govrin, Pardes-Hana-Karkur, IL;
Assignee:
Intel Corporation, Santa Clara, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 13/02 (2006.01); G06T 7/00 (2006.01); G06K 9/00 (2006.01); H04N 13/00 (2006.01);
U.S. Cl.
CPC ...
H04N 13/0018 (2013.01); G06T 2207/20021 (2013.01); H04N 2013/0081 (2013.01); H04N 13/0239 (2013.01); G06T 7/0075 (2013.01);
Abstract
Systems and methods may provide for determining a one-dimensional (1D) disparity between a plurality of rectified images, and extracting depth information from the plurality of rectified images based at least in part on the 1D disparity. In one example, the 1D disparity is in the horizontal direction and the images are rectified with respect to one another in the vertical direction.