The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 26, 2014

Filed:

Jun. 25, 2009
Applicants:

Gregory A. Martin, Portland, OR (US);

David D. Farrell, Tualatin, OR (US);

Evan A. Dickinson, Portland, OR (US);

Inventors:

Gregory A. Martin, Portland, OR (US);

David D. Farrell, Tualatin, OR (US);

Evan A. Dickinson, Portland, OR (US);

Assignee:

Tektronix, Inc., Beaverton, OR (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 13/02 (2006.01);
U.S. Cl.
CPC ...
G01R 13/0227 (2013.01);
Abstract

A test and measurement instrument and method of switching waveform display styles includes acquiring an electrical signal, storing peak detect data samples from the electrical signal to one or more memory devices, storing filtered data samples or unfiltered data from the electrical signal, automatically switching to a first waveform display style having the peak detect data samples configured in a first mode when a user selects the unfiltered data, and automatically switching to a second waveform display style having the peak detect data samples configured in a second mode when the user selects the filtered data samples.


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