The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 26, 2014

Filed:

Oct. 28, 2009
Applicants:

Deepak Ramappa, Cambridge, MA (US);

Dennis Rodier, Francestown, NH (US);

Inventors:

Deepak Ramappa, Cambridge, MA (US);

Dennis Rodier, Francestown, NH (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/00 (2006.01); H01L 21/425 (2006.01); H01L 27/146 (2006.01); H01L 31/18 (2006.01); H01L 21/762 (2006.01);
U.S. Cl.
CPC ...
H01L 27/14603 (2013.01); H01L 27/14683 (2013.01); H01L 31/1804 (2013.01); Y02E 10/547 (2013.01); H01L 21/76237 (2013.01);
Abstract

Dark currents within a photosensitive device are reduced through improved implantation of a species during its fabrication. Dark currents can be caused by defects in the photo-diode device, caused during the annealing, implanting or other processing steps used during fabrication. By amorphizing the workpiece in the photo-diode region, the number of defects can be reduced thereby reducing this cause of dark current. Dark current is also caused by stress induced by an adjacent STI, where the stress caused by the liner and fill material exacerbate defects in the workpiece. By amorphizing the sidewalls and bottom surface of the trench, defects created during the etching process can be reduced. This reduction in defects also decreases dark current in the photosensitive device.


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