Dynamic clock domain bypass for scan chains

Abstract

An integrated circuit comprises scan test circuitry and additional circuitry subject to testing utilizing the scan test circuitry. The scan test circuitry comprises at least one scan chain having a plurality of sub-chains associated with respective distinct clock domains, and clock domain bypass circuitry configured to selectively bypass one or more of the sub-chains. The scan chain is configurable in a scan shift mode of operation to form a serial shift register that includes fewer than all of the sub-chains with at least a remaining one of the sub-chains being bypassed by the clock domain bypass circuitry so as to not be part of the serial shift register in the scan shift mode. By selectively bypassing portions of the scan chain associated with particular clock domains, the clock domain bypass circuitry serves to reduce test time and power consumption during scan testing.