logo

For the Inventor, By the Inventor

The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8811463 B1

PDFFull Text
Date of Patent:
Aug. 19, 2014

Filed:

Jan. 29, 2013

Jitter measuring trigger generator, jitter measuring apparatus using the same, method of generating jitter measuring trigger, and method of measuring jitter

Applicant:

Anritsu Corporation, Kanagawa, JP;

Inventors:

Takashi Murakami, Kanagawa, JP;

Hisashi Matsumoto, Kanagawa, JP;

Assignee:

Anritsu Corporation, Atsugi-Shi, JP;

Attorney:

Pearne & Gordon LLP

Primary Examiner:

Shuwang Liu

Assistant Examiner:

Nader Bolourchi

Int. Cl.
CPC ...
H04B 3/46 (2006.01); H04B 17/00 (2006.01); H04Q 1/20 (2006.01); G01R 31/317 (2006.01); H03B 19/00 (2006.01); G01R 29/02 (2006.01);
U.S. Cl.
CPC ...
G01R 29/02 (2013.01); G01R 31/31709 (2013.01); H03B 19/00 (2013.01);
Abstract

A phase adjusterreceives a trigger clock synchronized with a data signal to be measured as input, and controls the phase of the trigger clock such that the trigger period of samples of the data signal to be measured becomes one sample per bit. An adjustable frequency dividerhas a frequency division ratio which is set such that a trigger pulse is generated at the fixed timing of the waveform pattern of the data signal to be measured. An interleaving unituses a discrete value which is in prime relation to the measured pattern length of the data signal to be measured, and acquires data for the number of samples corresponding to the measured pattern length from a samplerby the trigger pulse from the adjustable frequency divider

Find Patent Forward Citations

Murakami, Takashi. (2014). Jitter measuring trigger generator, jitter measuring apparatus using the same, method of generating jitter measuring trigger, and method of measuring jitter (U.S. Patent No. 8811463). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8811463

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…