The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 19, 2014
Filed:
Jun. 04, 2012
Jiachun Zhou, Gilbert, AZ (US);
Dexian Liu, Jiangsu, CN;
Siang Soh, Milpitas, CA (US);
Brian Hahn, Gilbert, AZ (US);
Bizhao LI, Jiangsu, CN;
Jiachun Zhou, Gilbert, AZ (US);
Dexian Liu, Jiangsu, CN;
Siang Soh, Milpitas, CA (US);
Brian Hahn, Gilbert, AZ (US);
Bizhao Li, Jiangsu, CN;
Interconnect Devices, Inc., Kansas City, KS (US);
Abstract
A socket for use in a test system is provided, where the test system is configured to align at least a portion of an electronic device with a plurality of aligned connectors. The socket can include a metal structure having a plurality of openings, the plurality of openings spaced to accommodate the plurality of aligned connectors. At least one opening in the plurality of openings can extend through a thickness of the metal structure and can have an annular inner surface. The annular inner surface can be proximal to at least a portion of a conductive outer surface of at least one aligned connector of the plurality of aligned connectors in the test system. The socket can further include an insulation layer provided on the annular inner surface.