The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 12, 2014

Filed:

May. 03, 2011
Applicants:

Yuan LI, San Diego, CA (US);

Julien Nicolas, San Diego, CA (US);

Jianbin Zhu, Poway, CA (US);

Inventors:

Yuan Li, San Diego, CA (US);

Julien Nicolas, San Diego, CA (US);

Jianbin Zhu, Poway, CA (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 13/03 (2006.01); H04L 1/00 (2006.01);
U.S. Cl.
CPC ...
H04L 1/0068 (2013.01);
Abstract

Provided are systems and methods for rate matching and de-rate matching on digital signal processors. For example, there is a system for rate matching and de-rate matching, where the system includes a memory configured to contain a plurality of blocks of data, and a digital signal processor configured to pre-compute permutation parameters common to the plurality of blocks, wherein the plurality of blocks are subject to a set of given puncturing parameters. The digital signal processor is configured to process each block in the plurality of blocks by computing a block signature from pre-computed puncturing thresholds, matching the block signature to one of a set of pre-computed zone signatures, deriving a zone index corresponding to the one matched pre-computed zone signature, and applying pre-computed permutation and puncturing transformations corresponding to the zone index to the block.


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