The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 05, 2014

Filed:

Jul. 24, 2008
Applicants:

Alexander Y. Tetelbaum, Hayward, CA (US);

Richard A. Laubhan, Windsor, CO (US);

Inventors:

Alexander Y. Tetelbaum, Hayward, CA (US);

Richard A. Laubhan, Windsor, CO (US);

Assignee:

LSI Corporation, Milpitas, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

An extraction tool for, and method of, determining a stage delay associated with an integrated circuit (IC) interconnect. In one embodiment, the extraction tool includes: (1) a driver strength estimator configured to extract dimensions of a driver associated with the interconnect and estimate a driver strength therefrom, (2) a driver delay estimator coupled to the driver strength estimator and configured to estimate a driver delay based on the driver strength, (3) an interconnect delay estimator configured to estimate an interconnect delay based on extracted C and RC parameters associated with the interconnect and (4) a stage delay estimator coupled to the driver delay estimator and the interconnect delay estimator and configured to estimate the stage delay based on the driver delay and the interconnect delay.


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