The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 05, 2014
Filed:
Jul. 08, 2013
International Business Machines Corporation, Armonk, NY (US);
Jeanne P. S. Bickford, Essex Junction, VT (US);
Anand Kumaraswamy, Bangalore, IN;
Terry M. Lowe, Apex, NC (US);
Mark S. Styduhar, Hinesburg, VT (US);
Lijiang L. Wang, South Burlington, VT (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
In one embodiment, at least one design library element having a design marker shape is applied to a yield checking tool having library element types, each having a yield checking deck threshold and a marker shape. The design marker shape is compared to each of the marker shapes. A determination is made as to whether the design library element satisfies the yield checking deck threshold associated with the library element type having a matching marker shape. In another embodiment, a product design formed from a design library elements each having a design marker shape is applied to the yield checking tool in a similar manner. In instances where the design library elements do not satisfy the yield checking deck threshold, then the design library element is updated by modifying the design library elements, placement of the design library elements in the product design, and/or wiring connecting the design library elements.