The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 05, 2014

Filed:

Sep. 28, 2011
Applicants:

Thomas Amundsen, Turnersville, NJ (US);

Sean Philip Kearney, Marlton, NJ (US);

Shane Michael Edmonds, Monroeville, NJ (US);

Ynjiun Paul Wang, Cupertino, CA (US);

Timothy Good, Clementon, NJ (US);

Michael Miraglia, Hamilton, NJ (US);

Charles Joseph Cunningham, Iv, Havertown, PA (US);

Xiaoxun Zhu, Suzhou, CN;

Patrick Anthony Giordano, Glassboro, NJ (US);

Inventors:

Thomas Amundsen, Turnersville, NJ (US);

Sean Philip Kearney, Marlton, NJ (US);

Shane Michael Edmonds, Monroeville, NJ (US);

Ynjiun Paul Wang, Cupertino, CA (US);

Timothy Good, Clementon, NJ (US);

Michael Miraglia, Hamilton, NJ (US);

Charles Joseph Cunningham, IV, Havertown, PA (US);

Xiaoxun Zhu, Suzhou, CN;

Patrick Anthony Giordano, Glassboro, NJ (US);

Assignee:

Metologic Insturments, Inc., Blackwood, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 20/00 (2012.01); G06Q 20/20 (2012.01); G01G 23/00 (2006.01);
U.S. Cl.
CPC ...
G06Q 20/208 (2013.01); G01G 23/00 (2013.01);
Abstract

A POS-based checkout/scale system having (i) a bar code symbol reading subsystem for reading bar code symbols on products being purchased at a retail POS station, and (ii) a produce weigh scale having a weigh scale assembly for weighing one or more produce items on a weigh platter during produce weighing operations carried out at the time of checkout at said retail POS station. The system also includes an automatic produce weighing interference detection subsystem, supporting an IR-based light curtain about the weigh platter, automatically detects when any object is overhanging the weigh platter during produce weighing operations, and generates an alert signal when such conditions are automatically detected.

Published as:

Find Patent Forward Citations

Loading…