The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 22, 2014
Filed:
Nov. 01, 2013
Iix Inc., Tokyo, JP;
Hiroshi Murase, Tokyo, JP;
IIX Inc., Tokyo, JP;
Abstract
Provided is a luminance measurement method for accurately measuring luminance of each pixel even if pixel images of a display panel overlap each other on an imaging surface of a camera. Pixels of a display panel are imaged by a solid-state imaging camera. One or more pixels are turned on and imaged such that pixel images do not overlap each other on an imaging surface. A central exposure factor indicating luminance of the central part of the pixel image is calculated based on a picture element output corresponding to the central part. A peripheral exposure factor indicating luminance of the peripheral part of the pixel image is calculated based on a picture element output corresponding to the peripheral part. All pixels are turned on and imaged, and luminance of all pixels is calculated based on this imaged image, the central exposure factor, and the peripheral exposure factor.