The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 22, 2014
Filed:
Jun. 16, 2010
Adam J. Wright, Saratoga, CA (US);
Joseph W. Foerstel, Santa Clara, CA (US);
Mark Andrew Banke, San Jose, CA (US);
Ken A. Ito, San Jose, CA (US);
Adam J. Wright, Saratoga, CA (US);
Joseph W. Foerstel, Santa Clara, CA (US);
Mark Andrew Banke, San Jose, CA (US);
Ken A. Ito, San Jose, CA (US);
Altera Corporation, San Jose, CA (US);
Abstract
A system for testing a device under test (DUT), in which electrical coupling among a module board, a low profile connector, and, a DIB is established by applying a pressure on the module board toward the DUT, is provided. The system includes a test head bracket secured inside a test head, the test head bracket includes the module board having a first section including a plurality of connectors to couple a test analyzer to the module board, a second section including a plurality of contacts pads to electrically couple the module board to the DUT, and, a flexible board to enable the first section to be placed at an angle with respect to the second section. The test head bracket also includes a module board stiffener mechanically securing the first section and the second section to the test head and the low profile connector electrically couples the module board to the DUT.