The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 08, 2014
Filed:
Nov. 02, 2012
Jeol Ltd., Tokyo, JP;
Kazuya Yamazaki, Tokyo, JP;
JEOL Ltd., Tokyo, JP;
Abstract
A transmission electron microscope (TEM) includes an electron beam source (), an illumination lens (), a first objective lens (), a second objective lens (), a selected area aperture (), a projector lens (), a detector (), and a control portion (). A first plane () is located between the second objective lens () and the projector lens (). The control portion () performs first sets of processing for controlling the illumination lens () such that an electron beam (L) hits the sample (S), controlling the second objective lens () such that a diffraction pattern of the sample (S) is imaged onto the first plane (), and controlling the projector lens () such that a TEM image of the sample (S) formed by the second objective lens () is focused onto a second plane where the light-sensitive portion () of the detector () is disposed.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile