The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 08, 2014
Filed:
Jul. 24, 2012
Kazuhiko Matsumoto, Ibaraki, JP;
Atsuhiko Kojima, Ibaraki, JP;
Satoru Nagao, Chiba, JP;
Masanori Katou, Kanagawa, JP;
Yutaka Yamada, Ibaraki, JP;
Kazuhiro Nagaike, Kanagawa, JP;
Yasuo Ifuku, Kanagawa, JP;
Hiroshi Mitani, Kanagawa, JP;
Kazuhiko Matsumoto, Ibaraki, JP;
Atsuhiko Kojima, Ibaraki, JP;
Satoru Nagao, Chiba, JP;
Masanori Katou, Kanagawa, JP;
Yutaka Yamada, Ibaraki, JP;
Kazuhiro Nagaike, Kanagawa, JP;
Yasuo Ifuku, Kanagawa, JP;
Hiroshi Mitani, Kanagawa, JP;
Japan Science and Technology Agency, Saitama, JP;
Abstract
A method of detecting a detection target using a sensor requires a sensor having a transistor selected from the group of field-effect transistors or single electron transistors. The transistor includes a substrate, a source electrode disposed on the substrate and a drain electrode disposed on the substrate, and a channel forming a current path between the source electrode and the drawing electrode; an interaction-sensing gate comprising a specific substance; and a voltage gate. The method includes (a) providing the detection target on the interaction-sensing gate; (b) setting the gate voltage in the voltage gate at a predetermined level; (c) selectively interacting the specific substance with the detection target; (d) when the detection target interacts with the specific substance, changing a gate voltage in the voltage gate to adjust a characteristic of the transistor; and (e) measuring a change in the characteristic of the transistor to determine a presence of the detection target.