The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 01, 2014

Filed:

Oct. 18, 2010
Applicants:

Frank E. Gennari, Berkeley, CA (US);

Ya-chieh Lai, Antioch, CA (US);

Matthew W. Moskewicz, Berkeley, CA (US);

Michael C. Lam, Rancho Cucamonga, CA (US);

Gregory R. Mcintyre, El Cerrito, CA (US);

Inventors:

Frank E. Gennari, Berkeley, CA (US);

Ya-Chieh Lai, Antioch, CA (US);

Matthew W. Moskewicz, Berkeley, CA (US);

Michael C. Lam, Rancho Cucamonga, CA (US);

Gregory R. McIntyre, El Cerrito, CA (US);

Assignee:

Cadence Design Systems, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

Disclosed are methods, systems, and articles of manufacture for using pattern matching with an integrated circuit layout including recognizing shapes within the IC layout, identifying features for the shapes, and extracting situations for the respective features. The method may further include simulating the situations to determine a set of situations for modification based on an OPC requirement, modifying the set of situations to improve satisfaction of the OPC requirement, and reintegrating the modified set of situations into the IC layout. The method may also include simulating a subset of the extracted situations to determine aerial images of the subset, and tiling the subset of situations to form a larger aerial image. The method may also include removing overlap from a window based on the situations extracted for the window, calculating a density for each of the situations, and calculating a density for the window based on the density.


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