The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 01, 2014
Filed:
Nov. 15, 2011
Hongwei (Nick) Dai, Shanghai, CN;
Chen Du, Shanghai, CN;
Xian E He, Shanghai, CN;
Jian Niu, Shanghai, CN;
Hongwei (Nick) Dai, Shanghai, CN;
Chen Du, Shanghai, CN;
Xian E He, Shanghai, CN;
Jian Niu, Shanghai, CN;
International Business Machines Corporation, Armonk, NY (US);
Abstract
Disclosed are a method and system for improving timing closure in chip design. The method comprises: identifying a critical timing path in a chip design pattern, wherein a timing window of the critical timing path is smaller than a predetermined timing window; determining a variation of each segment of the critical timing path, wherein the variation indicates uncertainty of delay of a device and/or a wire caused by one or more factors; and changing at least one segment of the critical timing path based on the variation of each segment of the critical timing path to enlarge the timing window of the critical timing path. The method and system may enlarge a timing window of a critical timing path by reducing the variation thereof, thereby achieving timing closure in the chip design pattern.