The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 01, 2014

Filed:

Jan. 09, 2013
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Charles J. Alpert, Austin, TX (US);

Robert M. Averill, III, Wappingers Falls, NY (US);

Eric J. Fluhr, Round Rock, TX (US);

Zhuo Li, Cedar Park, TX (US);

Tuhin Mahmud, Austin, TX (US);

Jose L. P. Neves, Poughkeepsie, NY (US);

Stephen T. Quay, Austin, TX (US);

Chin Ngai Sze, Austin, TX (US);

Yaoguang Wei, Austin, TX (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

Mechanisms are provided for pruning a layer trait library for use in wire routing in an integrated circuit design process. The mechanisms receive a plurality of wirecodes and a metal stack definition. The mechanisms generate a verbose layer trait library based on all possible combinations of the wirecodes and layers of the metal stack definition. The mechanisms generate a pruned layer trait library by pruning the verbose layer trait library to remove redundant layer traits from the verbose layer trait library. In addition, the mechanisms store the pruned layer trait library for performing wire routing of an integrated circuit design.


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