The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 01, 2014
Filed:
Feb. 24, 2012
Applicant:
Toshiyuki Negishi, Gunma, JP;
Inventor:
Toshiyuki Negishi, Gunma, JP;
Assignee:
Advantest Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
Provided is a test apparatus comprising a plurality of pattern output sections. In a high-speed mode, each pattern output section outputs, as pattern data corresponding to at least one of a plurality of partial periods, the pattern data corresponding to an input pattern input to the pattern output section and the pattern data corresponding to input patterns input to other pattern output sections.
Negishi, Toshiyuki. (2014). Test apparatus (U.S. Patent No. 8769363). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8769363
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile