The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 01, 2014
Filed:
May. 15, 2013
Applicant:
Jeol Ltd., Tokyo, JP;
Inventor:
Takaya Satoh, Tokyo, JP;
Assignee:
JEOL Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/00 (2006.01); H01J 49/40 (2006.01);
U.S. Cl.
CPC ...
H01J 49/004 (2013.01); H01J 49/005 (2013.01); H01J 49/0031 (2013.01); H01J 49/0045 (2013.01);
Abstract
A tandem time-of-flight mass spectrometer is offered which can perform MS/MS measurements efficiently without sample wastage by ingeniously combining flight time ranges required by precursor ions with measurement times actually taken to measure the precursor ions. The mass spectrometer has an array input means for causing the flight time ranges required by selected precursor ions and the actually taken measurement times in which the precursor ions are measured to be appropriately arrayed in a time-sequential manner such that the flight time ranges and measurement times do not overlap each other.