The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 01, 2014
Filed:
Nov. 30, 2007
Warren Jackson, Palo Alto, CA (US);
Carl P. Taussig, Pala Alto, CA (US);
Ping Mei, Pala Alto, CA (US);
Albert Jeans, Pala Alto, CA (US);
Han-jun Kim, Pala Alto, CA (US);
Warren Jackson, Palo Alto, CA (US);
Carl P. Taussig, Pala Alto, CA (US);
Ping Mei, Pala Alto, CA (US);
Albert Jeans, Pala Alto, CA (US);
Han-Jun Kim, Pala Alto, CA (US);
Hewlett-Packard Development Company, L.P., Houston, TX (US);
Abstract
This invention provides a thin film device with minimized spatial variation of local mean height. More specifically, the thin film device has a substrate and at least one first structure having a first spatially varying weighted local mean height determined by a layer weighting function. The first structure has a first maximum height, a first minimum height and a first variation for a given averaging area. A compensation structure is also provided upon the substrate, the compensation structure having a second spatially varying weighted local mean height determined by the layer weighting function. The compensation structure also has a second maximum height, a second minimum height and a second variation for the given averaging area. The first structure and compensation structure combine to provide a combined structure upon the substrate with minimized spatial variation of a combined weighted local mean.