The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 24, 2014
Filed:
Jul. 20, 2010
Kuniaki Onizawa, Hitachinaka, JP;
Yoshio Kiyonari, Hitachinaka, JP;
Shigemi Oba, Hitachinaka, JP;
Tatsuya Fukugaki, Hitachinaka, JP;
Kuniaki Onizawa, Hitachinaka, JP;
Yoshio Kiyonari, Hitachinaka, JP;
Shigemi Oba, Hitachinaka, JP;
Tatsuya Fukugaki, Hitachinaka, JP;
Hitachi High-Technologies Corporation, Tokyo, JP;
Abstract
An object of the present invention is to provide a sample processing system, wherein writing to each RFID is equalized to eliminate unevenness in the use of sample containers. The configuration of the present invention can be realized by controlling the numbers of times (write counts) data is written to RFIDs, and by skipping data writing according to frequencies in the use of sample containers. Setting use information (count) of each IC tag, and comparing the use information with an average value of the use of the IC tags, make it possible to limit the write counts, which enables the equalization of writing to the IC tags, thereby making it possible to uniform the use of the sample containers in the system.