The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 24, 2014

Filed:

Mar. 18, 2010
Applicants:

Olaf Ostwald, Munich, DE;

Sherif Sayed Ahmed, Munich, DE;

Inventors:

Olaf Ostwald, Munich, DE;

Sherif Sayed Ahmed, Munich, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 13/00 (2006.01); G01R 27/26 (2006.01); G01S 7/41 (2006.01); G01F 23/00 (2006.01); G01V 8/00 (2006.01); G01S 13/89 (2006.01); G01S 13/88 (2006.01);
U.S. Cl.
CPC ...
G01S 7/411 (2013.01); G01F 23/0023 (2013.01); G01V 8/005 (2013.01); G01S 13/89 (2013.01); G01S 13/887 (2013.01);
Abstract

The invention relates to a method for detecting a covered dielectric object, where a microwave signal that can be modified in frequency is generated at a particular bandwidth and transmitted in the direction of the covered dielectric object. The microwave signal reflected by the object is then obtained from the three-dimensional measurement result in a lateral, two-dimensional pattern, a highest signal amplitude and a second-highest signal amplitude within a particular time period before or after the received microwave signal is identified in a plurality of pattern points of the pattern. The object is detected if an accumulation of pattern points of the pattern is present, in which the difference in each case between the highest and the second highest signal amplitude of the received microwave signal is less than a defined threshold value.


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