The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 24, 2014
Filed:
Apr. 29, 2006
Applicants:
Heinrich Klose, Jena, DE;
Karlheinz Bartzke, Jena, DE;
Juergen Heise, Jena, DE;
Ralf Wolleschensky, Jena, DE;
Matthias Burkhardt, Eichenberg, DE;
Inventors:
Heinrich Klose, Jena, DE;
Karlheinz Bartzke, Jena, DE;
Juergen Heise, Jena, DE;
Ralf Wolleschensky, Jena, DE;
Matthias Burkhardt, Eichenberg, DE;
Assignee:
Carl Zeiss Microscopy GmbH, Jena, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01D 5/34 (2006.01); H01J 3/14 (2006.01);
U.S. Cl.
CPC ...
Abstract
Device to adjust the position and/or size of a pinhole in a laser scanning microscope (LSM) where the pinhole is illuminated via a separate light source or the LSM laser and the pinhole is moved at a right angle to the optical axis until the receiver has the maximum intensity and the pinhole position is captured and saved together with the data attributed to the replaceable optical components.