The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 24, 2014
Filed:
Aug. 03, 2007
Kenichi Yagi, Mito, JP;
Takayuki Noda, Hitachinaka, JP;
Kenichi Takahashi, Naka, JP;
Kenji Teshigawara, Hitachinaka, JP;
Atsushi Suzuki, Hitachinaka, JP;
Kenichi Yagi, Mito, JP;
Takayuki Noda, Hitachinaka, JP;
Kenichi Takahashi, Naka, JP;
Kenji Teshigawara, Hitachinaka, JP;
Atsushi Suzuki, Hitachinaka, JP;
Hitachi High-Technologies Corporation, Tokyo, JP;
Abstract
An automatic analysis system, which is capable of quickly performing reinspection, includes a sample rack which holds a sample vessel containing a sample; a sample rack input unit in which the sample rack is input; a carrier line which carries the sample rack; a plurality of automatic analyzers arranged along the carrier line; a sample rack holding unit which holds the sample rack storing an analyzed sample; a sample rack collection unit which collects the sample rack storing an analyzed sample; a carrier line for reinspection which returns the sample rack containing a sample subjected to reinspection depending on analysis results; and a controller for returning the sample rack from the sample rack holding unit through the carrier line for reinspection and controlling any one of automatic analyzers different from one that has previously performed analysis to perform reanalysis of the sample.