The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8755054 B1

PDF
Full Text
Expired
Date of Patent:
Jun. 17, 2014

Filed:

Oct. 24, 2013
Applicant:

Chunghwa Picture Tubes, Ltd., Taoyuan, TW;

Inventors:

Chih-Wei Lin, Taichung, TW;

Min-Cheng Wang, Taipei County, TW;

Yung-Cheng Chen, Taoyuan County, TW;

Hung-Min Liu, Taipei, TW;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/14 (2006.01); G01B 11/24 (2006.01); G01B 11/02 (2006.01); G03F 7/20 (2006.01); G01B 11/08 (2006.01);
U.S. Cl.
CPC ...
G01B 11/24 (2013.01); G01B 11/02 (2013.01); G03F 7/70625 (2013.01); G01B 11/08 (2013.01);
Abstract

A method of measuring a surface structure of a display device is provided. The display device includes first and second substrates, first and second patterned light-shielding layers, and first and second pixel units. The first patterned light-shielding layer disposed on a surface of the first substrate includes first openings. The second patterned light-shielding layer disposed on the surface of the first substrate includes second openings. The first pixel unit includes first and second protrusions. The first protrusion correspondingly covers the first openings and a portion of the first patterned light-shielding layer. The second protrusion is disposed on and directly contacted with the first and second patterned light-shielding layers. The second pixel unit includes a third protrusion correspondingly covering the second openings and a portion of the second patterned light-shielding layer, wherein sizes of the second openings are smaller than sizes of the first openings.


Find Patent Forward Citations

Lin, Chih-Wei. (2014). Method of measuring surface structure of display device (U.S. Patent No. 8755054). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8755054

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