The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 17, 2014
Filed:
Jul. 01, 2010
Jung Hur, Bucheon-si, KR;
Moon-young Jeon, Seoul, KR;
Hong-min Kim, Seoul, KR;
Sang-kyu Yun, Chungju-si, KR;
Jong-kyu Hong, Gwangju-si, KR;
Jung Hur, Bucheon-si, KR;
Moon-Young Jeon, Seoul, KR;
Hong-Min Kim, Seoul, KR;
Sang-Kyu Yun, Chungju-si, KR;
Jong-Kyu Hong, Gwangju-si, KR;
Koh Young Technology Inc., Seoul, KR;
Abstract
A three dimensional shape measurement apparatus includes an illumination section and a grating transfer unit. The illumination section includes a light source unit generating a light and a grating unit changing the light generated by the light source unit into a grating pattern light having a grating pattern. The illumination section illuminates the grating pattern light onto a measurement target in a predetermined direction. The grating transfer unit transfers the grating unit in a predetermined inclination direction with respect to an extension direction of the grating pattern and an arrangement direction of the grating pattern. Thus, manufacturing cost may be reduced, and the three dimensional shape measurement apparatus may be easily managed.