The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 17, 2014

Filed:

Mar. 02, 2012
Applicants:

Tah-kang Ting, Taipei, TW;

Gyh-bin Wang, Hsinchu, TW;

Ming-hung Wang, Hsinchu, TW;

Chun-peng Wu, Hsinchu, TW;

Li-chin Tien, Hsinchu, TW;

Inventors:

Tah-Kang Ting, Taipei, TW;

Gyh-Bin Wang, Hsinchu, TW;

Ming-Hung Wang, Hsinchu, TW;

Chun-Peng Wu, Hsinchu, TW;

Li-Chin Tien, Hsinchu, TW;

Assignee:

Piecemakers Technology, Incorporation, Cyonglin Township, Hsin-Chu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 27/28 (2006.01); G11C 29/10 (2006.01); G06F 11/00 (2006.01); G01R 31/3193 (2006.01); G11C 29/50 (2006.01); G11C 29/02 (2006.01); G01R 31/317 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31932 (2013.01); G11C 29/50012 (2013.01); G11C 29/022 (2013.01); G01R 31/31727 (2013.01);
Abstract

A high speed test circuit receives a tester clock from a tester and it conducts a test on a circuit under test. The high speed test circuit generates a high frequency clock according to the tester clock, so it is capable of operating in two frequencies. The high speed test circuit tests the circuit under test according to the high frequency clock, and it performs a low speed operation according to a low frequency clock, which is for example the tester clock.


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