The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 17, 2014
Filed:
Jan. 05, 2011
Applicant:
Junkei Kou, Toyko, JP;
Inventor:
Junkei Kou, Toyko, JP;
Assignee:
JEOL Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/40 (2006.01); H01J 49/42 (2006.01); H01J 49/00 (2006.01);
U.S. Cl.
CPC ...
H01J 49/401 (2013.01); H01J 49/427 (2013.01); H01J 49/0031 (2013.01);
Abstract
A time-of-flight mass spectrometer has an ion transport region and a time-of-flight (TOF) mass analyzer. The ion transport region includes a collision cell (ion storage region), a steady potential region, and a variable potential region such that the difference in potential between the steady potential region and the variable potential region when ions passed through the steady potential region enter the steady potential region increases with increasing mass-to-charge ratio of ions. The mass analyzer causes the ions transported via the transport region to be accelerated along another optical axis at a given acceleration timing and guides the ions toward a detector.