The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 10, 2014

Filed:

Mar. 26, 2008
Applicants:

Juan Jenny LI, Basking Ridge, NJ (US);

David Mandel Weiss, Long Valley, NJ (US);

Inventors:

Juan Jenny Li, Basking Ridge, NJ (US);

David Mandel Weiss, Long Valley, NJ (US);

Assignee:

Avaya Inc., Basking Ridge, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01); G06F 9/45 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus for automatically generating a run-time instrumenter are disclosed. In accordance with the illustrative embodiment, an off-line analyzer first determines instrumentation locations for a program under test in accordance with a method called the Super Nested Block Method. After the instrumentation locations have been determined, source code for a run-time instrumenter is automatically generated based on the source code for the program under test and the instrumentation locations. The source code for the program under test and the run-time instrumenter are then compiled into executables, and a testing tool then executes the program under test and the run-time instrumenter in parallel.


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