The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 10, 2014

Filed:

Jun. 27, 2012
Applicants:

Cheng-lung Tsai, Hsin-Chu, TW;

Jui-hsuan Feng, Lotung, TW;

Sheng-wen Lin, Kaohsiung, TW;

Wen-li Cheng, Taipei, TW;

Wen-chun Huang, Tainan, TW;

Ru-gun Liu, Hsinchu County, TW;

Inventors:

Cheng-Lung Tsai, Hsin-Chu, TW;

Jui-Hsuan Feng, Lotung, TW;

Sheng-Wen Lin, Kaohsiung, TW;

Wen-Li Cheng, Taipei, TW;

Wen-Chun Huang, Tainan, TW;

Ru-Gun Liu, Hsinchu County, TW;

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present disclosure provides one embodiment of an integrated circuit (IC) method. The method includes building a pattern bank including a pattern having an area of interest. The method further includes recognizing that the pattern of the pattern bank corresponds to a pattern of an IC design layout. The method further includes identifying an area of interest of the pattern of the IC design layout that corresponds to the area of interest of the pattern of the pattern bank. The method further includes performing pattern recognition dissection on the area of interest of the pattern of the IC design layout to dissect the area of interest of the pattern of the IC design layout into a plurality of segments. The method further includes after performing pattern recognition dissection, producing a modified IC design layout.


Find Patent Forward Citations

Loading…