The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 10, 2014

Filed:

Sep. 29, 2010
Applicants:

Ahmed Kirmani, Cambridge, MA (US);

Ramesh Raskar, Cambridge, MA (US);

James Davis, Los Gatos, CA (US);

Inventors:

Ahmed Kirmani, Cambridge, MA (US);

Ramesh Raskar, Cambridge, MA (US);

James Davis, Los Gatos, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 15/00 (2006.01); G01S 7/481 (2006.01); G01S 7/486 (2006.01); G01S 17/89 (2006.01); H04N 3/02 (2006.01); H04N 5/225 (2006.01);
U.S. Cl.
CPC ...
G01S 7/481 (2013.01); G01S 7/4865 (2013.01); G01S 17/89 (2013.01); H04N 3/02 (2013.01); H04N 5/2256 (2013.01);
Abstract

In illustrative implementations of this invention, multi-path analysis of transient illumination is used to reconstruct scene geometry, even of objects that are occluded from the camera. An ultrafast camera system is used. It comprises a photo-sensor (e.g., accurate in the picosecond range), a pulsed illumination source (e.g. a femtosecond laser) and a processor. The camera emits a very brief light pulse that strikes a surface and bounces. Depending on the path taken, part of the light may return to the camera after one, two, three or more bounces. The photo-sensor captures the returning light bounces in a three-dimensional time image I(x,y,t) for each pixel. The camera takes different angular samples from the same viewpoint, recording a five-dimensional STIR (Space Time Impulse Response). A processor analyzes onset information in the STIR to estimate pairwise distances between patches in the scene, and then employs isometric embedding to estimate patch coordinates.


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