The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 10, 2014
Filed:
Feb. 01, 2011
Yasuhide Takeda, Saitama, JP;
Hiroyuki Nagai, Saitama, JP;
Yoji Ogino, Saitama, JP;
Tatsuya Yamada, Saitama, JP;
Yasuhide Takeda, Saitama, JP;
Hiroyuki Nagai, Saitama, JP;
Yoji Ogino, Saitama, JP;
Tatsuya Yamada, Saitama, JP;
Advantest Corporation, Tokyo, JP;
Abstract
An electronic device test apparatus which can optimize throughput and costs is provided. An electronic device test apparatuscomprises: a test cell clusterhaving cell groupsA toH each of which has a plurality of test cells; and a conveyor apparatussupplying test carriers to a plurality of the test cells, and each of the test cellhas: contactors; a flow pathconnected to a vacuum pumpand reducing pressure in a recessof a pocketso as to bring external terminalsand the contactorsinto contact; and a test circuit for running a test on an electronic circuit formed into a die