The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 10, 2014
Filed:
Feb. 14, 2012
Ramesh Raskar, Cambridge, MA (US);
Vitor Pamplona, Porto Alegre, BR;
Erick Passos, Teresina-Pi, BR;
Jan Zizka, Bratislava, SK;
Ramesh Raskar, Cambridge, MA (US);
Vitor Pamplona, Porto Alegre, BR;
Erick Passos, Teresina-Pi, BR;
Jan Zizka, Bratislava, SK;
Massachusetts Institute of Technology, Cambridge, MA (US);
Abstract
In exemplary implementations of this invention, cataracts in the human eye are assessed and mapped by measuring the perceptual impact of forward scattering on the foveal region. The same method can be used to measure scattering/blocking media inside lenses of a camera. Close-range anisotropic displays create collimated beams of light to scan through sub-apertures, scattering light as it strikes a cataract. User feedback is accepted and analyzed, to generate maps for opacity, attenuation, contrast and sub-aperture point-spread functions (PSFs). Optionally, the PSF data is used to reconstruct the individual's cataract-affected view.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile