The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 27, 2014

Filed:

Mar. 26, 2008
Applicants:

Juan Jenny LI, Basking Ridge, NJ (US);

David Mandel Weiss, Long Valley, NJ (US);

Inventors:

Juan Jenny Li, Basking Ridge, NJ (US);

David Mandel Weiss, Long Valley, NJ (US);

Assignee:

Avaya Inc., Basking Ridge, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/45 (2006.01); G06F 9/44 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for determining the number and location of instrumentation probes to be inserted into a program is disclosed. The method advantageously inserts the minimum number of probes that are required to obtain execution coverage for every node in the program's control-flow graph. In addition, the method requires only one bit to store each probe and does not require the assignment of weights to arcs or nodes of the control-flow graph. In the illustrative embodiment, the nodes of a control-flow graph are partitioned into non-empty sets, where each non-empty set corresponds to a super nested block of the program.


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