The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 27, 2014
Filed:
Jun. 30, 2011
Ramesh C. Tekumalla, Breinigsville, PA (US);
Partho Tapan Chaudhuri, Pune, IN;
Priyesh Kumar, Pune, IN;
Komal N. Shah, Mumbai, IN;
Ramesh C. Tekumalla, Breinigsville, PA (US);
Partho Tapan Chaudhuri, Pune, IN;
Priyesh Kumar, Pune, IN;
Komal N. Shah, Mumbai, IN;
LSI Corporation, San Jose, CA (US);
Abstract
An integrated circuit comprises scan test circuitry and additional circuitry subject to testing utilizing the scan test circuitry. The scan test circuitry comprises a plurality of scan chains, including at least one wrapper cell scan chain arranged between first and second circuitry cores of the additional circuitry, with the wrapper cell scan chain comprising a plurality of wrapper cells and being configurable to operate as a serial shift register in a scan shift mode of operation. At least one of the wrapper cells of the wrapper cell scan chain comprises a flip-flop having a throughput data path that is part of a scan shift path of the wrapper cell scan chain and not part of a functional path between the first and second circuitry cores. In an HDD controller embodiment, the first and second circuitry cores may comprise respective read channel and additional cores of a system-on-chip.