The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 27, 2014

Filed:

Jan. 05, 2012
Applicants:

Bradley R. Quinton, Vancouver, CA;

Andrew M. Hughes, Vancouver, CA;

Steven J. E. Wilton, Vancouver, CA;

Inventors:

Bradley R. Quinton, Vancouver, CA;

Andrew M. Hughes, Vancouver, CA;

Steven J. E. Wilton, Vancouver, CA;

Assignee:

Tektronix, Inc., Beaverton, OR (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H03K 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

In one general aspect, a data collection system for a circuit under test implemented as an integrated circuit or using a programmable logic device is disclosed. It comprises a configurable selection network connected to debug nodes of the circuit. The selection network can be reconfigured after implementation of the circuit to route data from selectable debug nodes in the circuit under test to a controller to allow analysis of the circuit. The data collection system can further comprise a configurable data packer. A method of use of the system associates data from the debug nodes with individual debug nodes of the circuit based on a configuration of the configurable selection network or that of the configurable data packer or both. The method and system of the invention allows for efficient data collection from different sets of debug nodes without having to re-implement the circuit.


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