The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 20, 2014
Filed:
Jan. 06, 2012
Zhuo Zhang, Mercer Island, WA (US);
Harry J. Paarsch, Seattle, WA (US);
Patrick Ludvig Bajari, Bellevue, WA (US);
Sameer R. Rajyaguru, Bellevue, WA (US);
Ivan Eduardo Gonzalez, Seattle, WA (US);
Devesh R. Raval, Seattle, WA (US);
Zhuo Zhang, Mercer Island, WA (US);
Harry J. Paarsch, Seattle, WA (US);
Patrick Ludvig Bajari, Bellevue, WA (US);
Sameer R. Rajyaguru, Bellevue, WA (US);
Ivan Eduardo Gonzalez, Seattle, WA (US);
Devesh R. Raval, Seattle, WA (US);
Amazon Technologies, Inc., Reno, NV (US);
Abstract
This disclosure is directed to measuring test effects using adjusted outlier data. Test data and control data may include some outlier data (i.e., right-side tails of distribution curves), which may bias the resultant data. The outlier data may be adjusted to reduce bias. A cutoff point is selected along the distribution of data. Data below the cutoff is maintained and used to determine an effect of the data below the cutoff point. The effect of the data above the cutoff may be processed as follows. Predictor data is identified from the data below, but near, the cutoff point. The predictor data may then be used determine the effect of the outlier data that is above the cutoff point. In some embodiments, the predictor data may be weighted and combined with a weighted portion of the outlier data to determine an effect of the data above the cutoff point.