The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 13, 2014
Filed:
May. 14, 2010
Jeanne P. Bickford, Essex Junction, VT (US);
Peter A. Habitz, Hinesburg, VT (US);
Baozhen LI, South Burlington, VT (US);
Paul S. Mclaughlin, Essex Junction, VT (US);
Dileep N. Netrabile, South Burlington, VT (US);
Jeanne P. Bickford, Essex Junction, VT (US);
Peter A. Habitz, Hinesburg, VT (US);
Baozhen Li, South Burlington, VT (US);
Paul S. McLaughlin, Essex Junction, VT (US);
Dileep N. Netrabile, South Burlington, VT (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method and system to predict a number of electromigration critical elements in semiconductor products. This method includes determining critical element factors for a plurality of library elements in a circuit design library using a design tool running on a computer device and based on at least one of an increased reliability temperature and an increased expected current. The method also includes determining a number of critical elements in a product based on: (i) numbers of respective ones of the plurality of library elements comprised in the product, and (ii) the critical element factors.