The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 13, 2014
Filed:
Jan. 12, 2012
Ramesh C. Tekumalla, Breinigsville, PA (US);
Prakash Krishnamoorthy, Bethlehem, PA (US);
Niranjan Anant Pol, Pune, IN;
Vineet Sreekumar, Mumbai, IN;
Ramesh C. Tekumalla, Breinigsville, PA (US);
Prakash Krishnamoorthy, Bethlehem, PA (US);
Niranjan Anant Pol, Pune, IN;
Vineet Sreekumar, Mumbai, IN;
LSI Corporation, San Jose, CA (US);
Abstract
An integrated circuit comprises scan test circuitry and additional circuitry subject to testing utilizing the scan test circuitry. The scan test circuitry comprises at least one scan chain having a plurality of scan cells, wherein the scan chain is separated into a plurality of scan segments with each such segment comprising a distinct subset of two or more of the plurality of scan cells. The scan test circuitry further comprises scan segment bypass circuitry configured to selectively bypass one or more of the scan segments in a scan shift mode of operation. The scan segment bypass circuitry may comprise a plurality of multiplexers and a scan segment bypass controller. The multiplexers are arranged within the scan chain and configured to allow respective ones of the scan segments to be bypassed responsive to respective bypass control signals generated by the scan segment bypass controller.